Kamis, 13 Februari 2014

[B196.Ebook] PDF Ebook Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press

PDF Ebook Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press

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Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press

Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press



Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press

PDF Ebook Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press

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Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press

This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life

  • Provides a unique methodological approach to understanding modern measurements
  • Important methods and devices are presented in a synthetic and easy-to-understand way
  • Includes end-of-chapter exercises and solutions

  • Sales Rank: #5014292 in Books
  • Published on: 2015-10-05
  • Original language: English
  • Number of items: 1
  • Dimensions: 9.50" h x 1.10" w x 6.40" l, .0 pounds
  • Binding: Hardcover
  • 400 pages

From the Back Cover

This book explores the modern role of measurement science for both the technically most advanced applications and in everyday and will help readers gain the necessary skills to specialize their knowledge for a specific field in measurement.

Modern Measurements is divided into two parts. Part I (Fundamentals) presents a model of the modern measurement activity and the already recalled fundamental bricks. It starts with a general description that introduces these bricks and the uncertainty concept. The next chapters provide an overview of these bricks and finishes (Chapter 7) with a more general and complex model that encompasses both traditional (hard) measurements and (soft) measurements, aimed at quantifying non-physical concepts, such as quality, satisfaction, comfort, etc.

Part II (Applications) is aimed at showing how the concepts presented in Part I can be usefully applied to design and implement measurements in some very important and broad fields. The editors cover System Identification (Chapter 8), Reliability (Chapter 9) and Electromagnetic Compatibility (Chapter 10) not only for their importance in many application areas, from manufacturing to health and safety, but also because their intrinsic complexity is the perfect test bench to prove the usefulness of the concepts introduced in Part I.

Additional features to enhance readers’ understanding of measurements:

  • Methods and devices are presented in a synthetic way to introduce readers to the basic concepts of electronic Instrumentation and Measurements (I&M)
  • The most recent evolutions of I&M are introduced using a unique methodological approach
  • End-of-chapter exercises and solutions

The aim of this book is to provide a snapshot on the most important topics in the measurement world today and help fill the gap between academic teaching strategies in the US and in Europe.

Alessandro Ferrero is a Professor at the Polytechnic University of Milan. He is a Fellow of the IEEE.

Dario Petri is a Professor at the University of Trento. He is a Fellow of the IEEE.

Paolo Carbone is a Professor at the University of Perugia. He is a Fellow of the IEEE and editor-in-chief of the international journal, ACTA IMEKO.

Marcantonio Catelani is a Professor at the University of Florence. He is a member of the IEEE and Chair of IMEKO TC10 Technical diagnostics.

About the Author
Alessandro Ferrero is a Professor at the Polytechnic University of Milan. He is a Fellow of the IEEE.

Dario Petri is a Professor at the University of Trento. He is a Fellow of the IEEE.

Paolo Carbone is a Professor at the University of Perugia. He is a Fellow of the IEEE and editor-in-chief of the international journal, ACTA IMEKO.

Marcantonio Catelani is a Professor at the University of Florence. He is a member of the IEEE and Chair of IMEKO TC10 Technical diagnostics.

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Modern Measurements: Fundamentals and ApplicationsFrom Wiley-IEEE Press PDF

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